Speaker
Description
The aim of this work is to determine the optimal chemical-etching exposure time required to produce an efficient reflective surface on scintillator strips. To achieve this goal, we investigated the light yield efficiency, optical transparency, and reflectivity of strips with varying reflective-layer thicknesses formed through controlled chemical etching. Light yield measurements were performed at a fixed distance between the trigger counters and the photomultiplier tube for strips exhibiting systematically varied reflective-surface thicknesses. Systems assembled from such strips are employed in high-energy physics experiments to detect charged particles. In particular, in the Mu2e and COMET experiments, events with cosmic muons registered by such systems are excluded from further data analysis.
